Ohtake Hiroto | System Devices Research Laboratories Nec Corporation
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概要
System Devices Research Laboratories Nec Corporation | 論文
- Solid-Electrolyte Nanometer Switch(Novel Device Architectures and System Integration Technologies)
- OFDM Error Vector Magnitude Distortion Analysis(Active Circuits/Devices/Monolithic Microwave Integrated Circuits,Emerging Microwave Techniques)
- A Metallurgical Prescription Suppressing Stress-induced Voiding (SIV) in Cu lines
- Effects of the Metallurgical Properties of Upper Cu Film on Stress-Induced Voiding (SIV) in Cu Dual-Damascene Interconnects
- High-Mobility Dual Metal Gate MOS Transistors with High-k Gate Dielectrics