Ide Tatsunori | Functional Devices Research Laboratories Nec Corporation
スポンサーリンク
概要
関連著者
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Ide Tatsunori
Functional Devices Research Laboratories Nec Corporation
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OHKUBO Shuichi
Functional Devices Research Laboratories, NEC Corporation
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IDE Tatsunori
Functional Devices Research Laboratories, NEC Corporation
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Okada Mitsuya
Functional Devices Research Laboratories Nec Corp.
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OKADA Mitsuya
Functional Devices Research Laboratories, NEC Corp.
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Iwanaga Toshiaki
Functional Devices Research Laboratories Nec Corporation
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Okada Morihiro
Advanced Materials & Technology Research Laboratories Nippon Steel Corporation
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Okada M
Nagoya Univ. Nagoya Jpn
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Honma Hiromi
Functional Devices Research Labolatories Nec Corporation
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OHKUBO Satoshi
Fujitsu Laboratories Ltd.
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IWANAGA Toshiaki
Functional Devices Research Laboratories, NEC Corporation
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Okada M
Faculty Of Science And Engineering Ritsumeikan University
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Ohkubo Shuichi
Ulsi Technology Laboratory Fujitsu Laboratories Ltd.
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Otsuka M
Sumita Optical Glass Inc.
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NAKANO Masaki
Functional Devices Research Laboratories, NEC Corporation
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Honma Hiromi
Multimedia Research Laboratories Nec Corporation
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MURAHATA Michio
Functional Devices Research Laboratories, NEC Corporation
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Ide Tatsunori
Multimedia Research Laboratories Nec Corporation
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Nakano Masaki
Multimedia Research Laboratories Nec Corporation
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Okada Mitsuya
Functional Devices Research Laboratories Nec Corporation
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Ohkubo Shuichi
Multimedia Research Laboratories Nec Corporation
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Murahata Michio
Functional Devices Research Laboratories Nec Corporation
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SUZUKI Michio
LEONIX Corporation
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IWANAGA Toshiaki
Multimedia Research Laboratories, NEC Corporation
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Iwanaga T
Functional Devices Research Laboratories Nec Corporation
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Iwanaga Toshiaki
Multimedia Research Laboratories Nec Corporation
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Ohkubo Syuichi
Functional Devices Research Laboratories, NEC Corporation,
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Ohkubo Shuichi
Functional Devices Research Laboratories, NEC Corporation, 4-1-1 Miyazaki, Miyamae-ku, Kawasaki, Kanagawa 216-8555, Japan
著作論文
- Relationship between Overwrite Characteristics and Linear Velocity in Mark Edge Recording with Phase-Change Media
- Improvement in Jitter Characteristics in Mark Edge Recording for Phase Change Media
- Spectroscopic Ellipsometry Studies on Optical Constants of Ge_2Sb_2Te_5 Used for Phase Change Optical Disks
- Optimization of Write Strategy in a Partial-Response-Maximum-Likelihood System for High-Density Recording
- Optimization of Write Strategy in a Partial-Response-Maximum-Likelihood System for High-Density Recording
- Phase Change Optical Disks Having Recording Marks with Large Optical Phase Difference Suitable for Mark Edge Recording