Lee Hee | Dept. Of Electrical Eng. Korea Advanced Institute Of Science And Technology
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Dept. Of Electrical Eng. Korea Advanced Institute Of Science And Technology | 論文
- Study on Gate Around Transistor (GAT) Layout for Radiation Hardness(Session9A: Silicon Devices IV)
- Study on Gate Around Transistor (GAT) Layout for Radiation Hardness(Session9A: Silicon Devices IV)
- A Study of LPE HgCdTe Wafer Characteristics Flattened with Single-Point Diamond Turning Method (先端デバイスの基礎と応用に関するアジアワークショップ(AWAD2005))
- A Study of LPE HgCdTe Wafer Characteristics Flattened with Single-Point Diamond Turning Method (先端デバイスの基礎と応用に関するアジアワークショップ(AWAD2005))
- In-Pixel Edge Detection Circuit without Non-uniformity Correction for an Infrared Focal Plane Array (IRFPA)