Wang Jiwen | Data Storage Institute, 5 Engineering Drive 1
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概要
関連著者
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Liu Bo
Data Storage Institute
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Liu Bo
Data Storage Institute 5 Engineering Drive
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Liu B
Data Storage Institute 5 Engineering Drive
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Liu B
Data Storage Institute
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Liu Bo
Data Storage Institute 5 Engineering Drive 1
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Liu Bo
Data Storage Institute National University Of Singapore
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YUAN Zhi-Min
Data Storage Institute
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Ding Jun
National University Of Singapore
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Ding J
National Univ. Singapore Singapore
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Wang Jiwen
Data Storage Institute, 5 Engineering Drive 1
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Wang Jiwen
Data Storage Institute 5 Engineering Drive 1
著作論文
- Stress Induced by Flash Temperature During Head-Disk Impact and Its Influence on Magnetic Degradation (第4回アジア情報記録技術シンポジウム〔英文〕)
- Stress induced by flash temperature during Head-Disk impact and its influence on magnetic degradation