Yoshida S | Niigata Univ. Niigata‐shi Jpn
スポンサーリンク
概要
関連著者
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Yoshida S
Okayama Univ. Okayama‐shi Jpn
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Yoshida S
Niigata Univ. Niigata‐shi Jpn
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Yoshida Shousei
Campc Research Laboratories Nec Corporation
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USHIROKAWA Akihisa
NEC Corporation
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MIZUGUCHI Hironori
NEC C&C Media Research Labs., NEC Corporation
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YOSHIDA Shousei
NEC C&C Media Research Labs., NEC Corporation
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Mizuguchi Hironori
Nec C&c Media Research Labs. Nec Corporation
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Ushirokawa A
C&c Media Research Laboratory Nec Corp.
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Lee P
Hitachi Ltd. Kodaira‐shi Jpn
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Lee Peter
The Authors Are With The Semiconductor And Ic Division Hitachi Ltd.
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AOYAMA Akio
NEC C&C Media Research Labs., NEC Corporation
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SEO Tsuyoshi
The authors are with the Hitachi ULSI Systems Co., Ltd.
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ISE Kiyoshi
The authors are with the Semiconductor and IC Division, Hitachi, Ltd.
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HIRAISHI Atsushi
The authors are with the Semiconductor and IC Division, Hitachi, Ltd.
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NAGASHIMA Osamu
The author is with the Device Development Center, Hitachi, Ltd.
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YOSHIDA Shoji
The authors are with the Hitachi ULSI Systems Co., Ltd.
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Aoyama Akio
Nec C&c Media Research Labs. Nec Corporation
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Ise K
The Authors Are With The Semiconductor And Ic Division Hitachi Ltd.
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Seo Tsuyoshi
The Authors Are With The Hitachi Ulsi Systems Co. Ltd.
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Hiraishi Atsushi
The Authors Are With The Semiconductor And Ic Division Hitachi Ltd.
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Nagashima O
Elpida Memory Inc. Sagamihara‐shi Jpn
著作論文
- Performance Evaluation of CDMA Adaptive Interference Canceller with RAKE Structure Using Developed Testbed in Multiuser and Multipath Fading Environment (Special Section on Spread Spectrum Techniques and Applications)
- Performance Evaluation on Power Control and Diversity of Next-Generation CDNA System(Special Issue on Third Generation Land Mobile Communication Systems)
- Application of Circuit-Level Hot-Carrier Reliability Simulation to Memory Design