Um Woo | Material Testing Laboratory Test & Inspection Center Korea Academy Of Industrial Technology
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概要
- 同名の論文著者
- Material Testing Laboratory Test & Inspection Center Korea Academy Of Industrial Technologyの論文著者
関連著者
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Kim D
Seoul National Univ. Seoul Kor
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Kim Dae
Inter-university Semiconductor Research Center School Of Electrical Engineering Seoul National Unive
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Um Woo
Material Testing Laboratory Test & Inspection Center Korea Academy Of Industrial Technology
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KIM Duk
Department of Information and Communication Engineering, Inha University
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KIM Ho
Department of Neurosurgery, Division of Biostatistics in Graduate School of Public Health University
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NO Kwangsoo
Department of Materials Science and Engineeing, KAIST
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Kim D
Inter-university Semiconductor Research Center School Of Electrical Engineering Seoul National Unive
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Kim H
Korea Advanced Inst. Sci. And Technol. Taejon Kor
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No Kwangsoo
Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology
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No Kwangsoo
Department Of Material Science And Engineering Korea Advanced Institute Of Science And Technology
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Kim Duk
Department Of Information And Communication Engineering Inha University
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UM Woo
Material Testing Laboratory, Test & Inspection Center, Korea Academy of Industrial Technology
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Um Woo.
Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology
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Kim Ho.
Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology
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Kim Duk.
Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology
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Kim Ho
Department Of Dermatology Kyungpook National University School Of Medicine
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Kim Duk
Department Of Biology Graduate School Kyung Hee University
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Kim Ho
Department Of Biostatistics And Epidemiology School Of Public Health & Institute Of Health And E
著作論文
- Influence of Oxygen Deficiency on Electrical Properties in the Superconductor (Bi, Pb)_2Sr_2Ca_2Cu_3O_y Phase
- Oxygen Behavior in the Superconductor (Bi,Pb)_2Sr_2Ca_2Cu_3O_y Phase Studied by X-Ray Photoelectron Spectroscopy