Chua Thiam | Centre For Integrated Circuit Failure Analysis And Reliability Faculty Of Engineering National Unive

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概要

関連著者

CHIM Wai
Centre for Integrated Circuit Failure Analysis and Reliability, Faculty of Engineering, National Uni
Chua Thiam
Centre For Integrated Circuit Failure Analysis And Reliability Faculty Of Engineering National Unive
Chim W
National Univ. Singapore Singapore
Chim Wai
Centre For Integrated Circuit Failure Analysis And Reliability Faculty Of Engineering National Unive

著作論文

Post-stress Dual-trap Interaction in Hot-carrier Stressed Submicrometer N-channel Metal-Oxide-Semiconductor Field-Effect-Transistors

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