Moon Hyun-chan | Department Of Electrical And Electronic Engineering Yonsei University
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概要
関連著者
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Lim Sung-hoon
Advanced Display Research Center Kyunghee University
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Park Yong-pil
Department Of Electronic Engineering Dongshin University
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Moon Hyun-chan
Department Of Electrical And Electronic Engineering Yonsei University
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SEO Dae-Shik
Department of Electrical and Computer Engineering, Yonsei University
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Hwang J‐y
Department Of Electrical & Electronic Engineering Yonsei University
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Hwang J‐y
Korea Basic Sci. Inst. Busan Kor
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Seo Dae-shik
Department Of Electrical Engineering College Of Engineering Soong Sil University
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Seo Dae-shik
Department Of Electrical And Electronic Engineering Yonsei University
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Hwang Jeoung-yeon
Department Of Electrical And Electronic Engineering Yonsei University
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Seo Dae-shik
Department Of Electrical & Computer Engineering College Of Engineering Yonsei University
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MOON Hyun-Chan
Department of Electrical and Electronic Engineering, Yonsei University
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KANG Hyung-Ku
Department of Electrical and Electronic Engineering, Yonsei University
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PARK Yong-Pil
Department of Electronic Engineering, Dongshin University
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JANG Jin
Advanced Display Research Center, Kyunghee University
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Kang Hyung-ku
Department Of Electrical And Electronic Engineering Yonsei University
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Hwang Jeoung-yeon
Department Of Electrical & Computer Engineering College Of Engineering Yonsei University
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Jang Jin
Advanced Display Research Center Kyung Hee University
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Moon Hyun-Chan
Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, Korea
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Park Yong-Pil
Department of Electrical Engineering, College of Engineering, Dongshin University, Naju, Jeonnam 520-714, Korea
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Jang Jin
Advanced Display Research Center and Department of Information Display, Kyung Hee University, Seoul 130-701, Korea
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Jang Jin
Advanced Display Research Center, Kyunghee University, Seoul 130-701, Korea
著作論文
- Vertical Alignment of Nematic Liquid Crystal by Rubbing-Free Method on the SiC Thin Film Layer
- Vertical Alignment of Nematic Liquid Crystal by Rubbing-Free Method on the SiC Thin Film Layer