Oku Yoshiaki | Mirai Project Association Of Super-advanced Electronics Technology (aset)
スポンサーリンク
概要
Mirai Project Association Of Super-advanced Electronics Technology (aset) | 論文
- Anomalous positive V_ shift in HfAlO_x MOS gate stacks
- Comparative Studies on Oxygen Diffusion Coefficients for Amorphous and γ-Al_2O_3 Films using ^O Isotope
- Comparative Studies on Oxygen Diffusion Coefficients for Amorphous and γ-Al2O3 Films using 18O Isotope
- Degradation Mechanism of HfAlO_x/SiO_2 Stacked Gate Dielectric Films through Transient and Steady State Leakage Current Analysis
- Impact of Surface Hydrophilicization prior to Atomic Layer Deposition for HfO_2/Si Direct-Contact Gate Stacks