BOKOR Jeffrey | Department of Electrical Engineering and Computer Science, University of California

スポンサーリンク

概要

関連著者

Choi Yang-kyu
University Of California At Berkeley Department Of Electrical Engineering And Computer Science
CHOI Yang-Kyu
Department of Electrical Engineering and Computer Science, University of California
HA Daewon
Department of Electrical Engineering and Computer Science, University of California
KING Tsu-Jae
Department of Electrical Engineering and Computer Science, University of California
BOKOR Jeffrey
Department of Electrical Engineering and Computer Science, University of California
Bokor Jeffrey
Department Of Electrical Engineering And Computer Science University Of California

著作論文

Investigation of Gate-Induced Drain Leakage (GIDL) Current in Thin Body Devices: Single-Gate Ultra-Thin Body, Symmetrical Double-Gate, and Asymmetrical Double-Gate MOSFETs

スポンサーリンク