Wada Naoki | Department of Electric and Electronic Engineering, University of Tokushima
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概要
Department of Electric and Electronic Engineering, University of Tokushima | 論文
- Structures for Thermal Stress Reduction in GaAs Layers Grown on Si Substrate
- Stress Distribution Analysis in Structured GaAs Layers Fabricated on Si Substrates
- Comparison of DMFT index scores between Korean and Japanese population
- Interplay of Excitonic Radiative Recombination and Ionization in Photocurrent Spectra of Thick Barrier GaAs/AlAs Multiple Quantum Wells
- Crystallization Process of Polycrystalline Silicon by KrF Excimer Laser Annealing