Sakuma Ichiro | Department of Engineering, University of Tokyo
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概要
Department of Engineering, University of Tokyo | 論文
- Antiferromagnetic Domain Structure Imaging of Cleaved NiO(100) Surface Using Nonmagnetic Linear Dichroism at O K Edge : Essential Effect of Antiferromagnetic Crystal Distortion(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Prop
- Magnetic Domain Imaging of Ni Micro Ring and Micro Dot array by Photoelectron Emission Microscopy
- Mechanism of Carrier Mobility Degradation Induced by Crystallization of HfO_2 Gate Dielectrics
- Fabrication and Characterization of AlN/InN Heterostructures
- Electronic Band Structure of Transparent Conductor : Nb-Doped Anatase TiO_2