Kawabata Shiro | <sup>2</sup>Nanotechnology Research Institute, AIST, Tsukuba, Ibaraki 305-8568
スポンサーリンク
概要
論文 | ランダム
- Current Gain and Voltage Gain in Hot Electron Transistors without Base Layer(THz Devices,Heterostructure Microelectronics with TWHM2005)
- Charging Time of Double-Layer Emitter in Heterojunction Bipolar Transistor Based on Transmission Formalism
- Double-Slit Interference Observation of Hot Electrons in Semiconductors : Analysis of Experimental Data
- Numerical Foundation of Hot-Electron Diffraction Experiment Based on Ballistic Electron Emission Microscope
- 弾道電子放出顕微鏡によるホットエレクトロン回折実験の数値解析 : 量子相反性成立の起源(量子効果デバイス及び関連技術)