Toshikazu Wada | the Faculty of System Engineering, Wakayama University
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概要
the Faculty of System Engineering, Wakayama University | 論文
- Wear Durability and Adhesion Evaluation Methods for Ultrathin Overcoat Films by Atomic Force Microscopy
- RK-Means Clustering : K-Means with Reliability
- K-means clustering based pixel-wise object tracking (コンピュータビジョンとイメージメディア)
- Object Tracking with Target and Background Samples(Image Recognition, Computer Vision)
- K-means tracker : A multiple colors object tracking algorithm