Ohta Hiroshi | Optical Measurement Technology Development Co. Ltd.
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概要
Optical Measurement Technology Development Co. Ltd. | 論文
- Evaluation of Surface Zn Concentration in Zn Diffusion into InP
- Wide-Wavelength GaInAs PIN Photodiodes Using a Lattice-Mismatched Light-Absorbing Layer and a Thin InP Cap Layer
- Estimation of Electron Temperatures from I-V Characteristics of a Plasma Electrode of a Negative Ion Source
- Production of Diatomic and Triatomic Molecular Negative Ions of Gold and Copper by Sputtering
- Measurement of H^- Density in a Magnetized Plasma