Xu Wei | Data Storage Institute, DSI Building
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概要
Data Storage Institute, DSI Building | 論文
- Thickness Dependent Nano-Crystallization in Ge_2Sb_2Te_5 films and Its Effect on Devices
- Three-Dimensional Thermal Modelling and Analysis of Near-Field Phase Change Optical Disks
- Investigation on Super-Resolution Near-Field Blu-Ray-Type Phase-Change Optical Disk with Sb_2Te_3 Mask Layer
- Super-Resolution Near-Field Phase Change Disk with Sb_Te_ Mask Layer
- New Structure of Dual-Layer Rewritable Phase-Change Optical Disc