伊藤 昭夫 | Electrotechnical laboratory
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概要
Electrotechnical laboratory | 論文
- 薄膜基板温度観察装置の試作
- Temperature-Dependent Change of Correlated Electronic States in Yb_4As_3 and Yb_4(As_Sb_x)_3 Probed by High Resolution Photoemission Spectroscopy
- Development of Scanning Probe Microscope for Auger Analysis
- Development of Electron Source for Auger Electron Spectroscopy in Scanning Probe Microscope Systems
- Electronic Structure of Ni Intercalated TiS_2 Probed by Angle Resolved and 2p Core Resonance Photoemission as Well as by 2p Core Absorption Spectroscopy