Sunakawa Haruo | Fundamental Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305, Japan
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概要
- Sunakawa Haruoの詳細を見る
- 同名の論文著者
- Fundamental Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305, Japanの論文著者
論文 | ランダム
- Evaluation of image drift correction by three-dimensional Fourier analysis
- 腹部腫瘍の超音波診断
- Preliminary experiments for development of real-time defocus-image modulation processing electron microscope
- Cross-Sectional Transmission Electron Microscope Observation of Isolated Diamond Particles Heteroepitaxially Grown on Pt(111) Substrate
- Observation of Al surface during sputter-cleaning and annealing procedures under UHV-REM