TODAKA Takashi | KOBELCO Research Institute
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概要
KOBELCO Research Institute | 論文
- Application of Microwave Photoconductivity Decay Method to Characterization of Amorphous In-Ga-Zn-O Films
- Comparison of Silicon-on-Insulator Wafer Mappings between Photoluminescence Intensity and Microwave Photoconductivity Decay Lifetime
- Application of Microwave Photoconductivity Decay Method to Characterization of Amorphous In-Ga-Zn-O Films
- Effects of Zr Addition on the Microstructure of 14%Cr4%Al ODS Ferritic Steels
- Characterization of Mechanically Alloyed Powders for High-Cr Oxide Dispersion Strengthened Ferritic Steel