Teh Gim | Centre for Integrated Circuit Failure Analysis and Reliability, Faculty of Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260

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• 同名の論文著者
• Centre for Integrated Circuit Failure Analysis and Reliability, Faculty of Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260の論文著者

Centre for Integrated Circuit Failure Analysis and Reliability, Faculty of Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260 | 論文

• Random Telegraphic Signals and Low-Frequency Noise in Rapid-Thermal-Annealed Silicon-Silison Oxide Structures

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