Fujii Yoshinobu | Department of Electronics and Information Systems, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
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- 同名の論文著者
- Department of Electronics and Information Systems, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japanの論文著者
Department of Electronics and Information Systems, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan | 論文
- Two-Dimensional Simulation of Quantum Tunneling across Barrier with Surface Roughness
- Novel Method of Intrinsic Characteristic Extraction in Lightly Doped Drain Metal Oxide Semiconductor Field Effect Transistors for Accurate Device Modeling