Jung Gwan | The University of Seoul
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概要
The University of Seoul | 論文
- Transport properties in ferromagnetic double barrier junctions
- Effect of doubly plasma oxidation time on TMR devices (第7回アジア情報記録技術シンポジウム〔英文〕)
- Effect of doubly plasma oxidation time on TMR devices
- Special Issue on Nanojoining and Microjoining