宮野 靖 | Kanazawa Institute of Technology
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概要
Kanazawa Institute of Technology | 論文
- Efficient Method to Measure IMD of Power Amplifier with Simplified Phase Determination Procedure to Clarify Memory Effect Origins
- Non-linear Distortion Caused by the Electrical Memory Effect and its Dependence on the Circuit Parameters of a GaAs MESFET Amplifier
- Non-linear Distortion Caused by the Electrical Memory Effect and its Dependence on the Circuit Parameters of a GaAs MESFET Amplifier
- Non-linear Distortion Caused by the Electrical Memory Effect and its Dependence on the Circuit Parameters of a GaAs MESFET Amplifier
- Non-linear Distortion Caused by the Electrical Memory Effect and its Dependence on the Circuit Parameters of a GaAs MESFET Amplifier