HASHIZUME Tamotsu | Research Center for Interface Quantum Electronics, and Graduate School of Electronics and Information Engineering, Hokkaido University

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• Research Center for Interface Quantum Electronics, and Graduate School of Electronics and Information Engineering, Hokkaido Universityの論文著者

Research Center for Interface Quantum Electronics, and Graduate School of Electronics and Information Engineering, Hokkaido University | 論文

• A Novel Non-Destructive Characterization Method of Electronic Properties of Pre- and Post-Processing Silicon Surfaces Based on Ultrahigh-Vacuum Contactless Capacitance-Voltage Measurements

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