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Zhang Jingwen | 論文著者
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ZHANG Jingwen
Hebei Entry-Exit Inspection and Quarantine Bureau
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Zhang Jingwen
Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Key Laboratory of Photonics Technology for Information of Shaanxi Province and ISCAS-XJTU Joint Laboratory of Functional Materials and Devices for Informatics, School of Ele
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Zhang Jingwen
Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Key Laboratory of Photonics Technology for Information of Shaanxi Province and ISCAS-XJTU Joint Laboratory of Functional Materials and Devices for Informatics, School of Ele
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Zhang Jingwen
Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Key Laboratory of Photonics Technology for Information of Shaanxi Province and ISCAS-XJTU Joint Laboratory of Functional Materials and Devices for Informatics, School of Ele
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Zhang Jingwen
Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Key Laboratory of Photonics Technology for Information of Shaanxi Province and ISCAS-XJTU Joint Laboratory of Functional Materials and Devices for Informatics, School of Ele
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Zhang Jingwen
National Laboratory Of Crystal Materials Shandong University
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ZHANG Jingwen
National Laboratory of Crystal Materials, Shandong University
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Zhang Jingwen
National Laboratory of Crystal Materials, Shandong University, Jinan 250100, China