Yoshikawa Nobuyuki | 論文著者

Department Of Electrical And Computer Engineering Yokohama National University

Department of Electrical and Computer Engineering, Yokohama National University

Dept. of Electrical and Computer Engineering, Yokohama National University

Faculty Of Agriculture Iwate University

Faculty of Agriculture, Iwate University

Faculty Of Engineering Yokohama National University

Faculty of Engineering, Yokohama National University

Faculty of Engineering, Yokohama National University,

Faculty of Engineering, Yokohama National University, Tokiwadai 79-5, Hodogaya, Yokohama 240, Japan

Faculty of Engineering, Yokohama National University, 156 Tokiwadai, Hodogaya–ku, Yokohama 240, Japan

Faculty of Engineering, Yokohama National University, 79–5 Tokiwadai, Hodogaya–ku, Yokohama 240–8501, Japan

Faculty of Engineering, Yokohama National University, Hodogaya, Yokohama, 240

Faculty of Engineering, Yokohama National University, Tokiwadai 156, Hodogaya, Yokohama 240, Japan

Institute of Advanced Sciences, Yokohama National University|Department of Electrical and Computer Engineering, Yokohama National University

Plant Pathology Laboratory Faculty Of Agriculture Iwate University

Plant Pathology Laboratory, Faculty of Agriculture

Plant Pathology Laboratory, Faculty of Agriculture, Iwate University

The author is with Yokohama National University

The Division Of Electrical And Computer Engineering Yokohama National University

the Division of Electrical and Computer Engineering, Yokohama National University