YU Guolin | 論文著者

Department of Electrical and Computer Engineering, Nagoya Institute of Technology

Department of Electrical and Computer Engineering, Nagoya Institute of Technology, Gokiso–cho, Showa–ku, Nagoya 466, Japan

Institute for Microstructural Sciences M50, National Research Council of Canada, Montreal Road, Ottawa, Ontario K1A 0R6, Canada

Nagoya Institute of Technology

Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan

National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China

Research Center for Micro-Structure Devices, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan

Research Center for Micro–Structure Devices, Nagoya Institute of Technology, Gokiso–cho, Showa–ku, Nagoya 466, Japan

Research Center for Micro–Structure Devices, Nagoya Institute of Technology, Nagoya 466, Japan

Research Centerfor Micro-Structure Devices, Nagoya Institute of Technology