WEI Sun-Chin | 論文著者

Da-Yeh Institute of Technology, Graduate School of Electrical Engineering

Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit

Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit

Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit

Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit

Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit

Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit

Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit

Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung Universit

Department Of Electrical Engineering And Institute Of Microelectronics National Cheng Kung University

Department of Electrical Engineering and Institute of Microelectronics, National Cheng Kung University

Department of Electrical Engineering and Institute of Microelectronics, National Cheng Kung University, No. 1, Ta Hsueh Rd., Tainan, Taiwan 70101, R.O.C.

Institute Of Electrical Engineering Da-yeh University

Institute of Electrical Engineering, Da-Yeh University

Institute of Electrical Engineering, Da-Yeh University, Chang-Hwa 515, Taiwan

Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University

Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University

Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan