Tao Chen | 論文著者

Department of Solid State Electronics, Huazhong University of Science and Technology

Laboratory of Electronic Components, Technology and Materials (ECTM), Delft Institute of Microelectronics and Submicron Technology (DIMES), Delft University of Technology, Feldmannweg 17, P. O. Box 5053, 2600 GB Delft, The Netherlands

State Key Lab of Silicon Materials, Zhejiang University, Hangzhou 310027, China