SAWABE Atsuhito | 論文著者

Department Of Electrical Engineering And Electronics Aoyama Gakuin University

Department Of Electrical Engineering And Electronics Aoyama-gakuin University

Department of Electrical Engineering and Electronics, Aoyama Gakuin University

Department of Electrical Engineering and Electronics, Aoyama-Gakuin University

Department of Electrical Engineering and Electronics, Aoyama-Gakuin University, 6-16-1 Chitosedai, Setagaya, Tokyo 157-8572, Japan

Department of Electrical Engineering and Electronics, Aoyama–Gakuin University, 6–16–1 Chitosedai, Setagaya–ku, Tokyo 157, Japan

Department of Electrical Engineering and Electronics, Aoyama–Gakuin University, 6–16–1 Chitosedai, Setagaya–ku, Tokyo 157–8572, Japan

Department of Electrical Engineering and Electronics, College of Science and Engineering, Aoyama Gakuin University, Sagamihara 229-8558, Japan

Materials And Devices Laboratories Research And Development Center Toshiba Corporation

Materials and Devices Laboratories, Research and Development Center, Toshiba Corporation

Materials and Devices Laboratories, Research and Development Center, Toshiba Corporation, 1, Komukai, Toshiba–cho Saiwai–ku, Kawasaki 210, Japan

Materials And Devices Research Laboratorices Research And Development Center Toshiba Corporation

Materials and Devices Research Laboratorices, Research and Development Center, Toshiba Corporation

Materials and Devices Research Laboratories, Research and Development Center, Toshiba Corporation

R & D Center, Toshiba Corporation

R & D Center, Toshiba Corporation

R&d Center Toshiba Corporation

R&D Center, Toshiba Corporation

R&D Center, Toshiba Corporation

Toshiba Corporation R&d Center