PARK Jong | 論文著者

Semiconductor R&D Division, SAMSUNG ELECTRONICS

Seoul National University

Seoul St. Mary's Hospital

Seoul St. Mary's Hospital The Catholic University Of Korea

Seoul St. Mary's Hospital, The Catholic University of Korea

Sungkyunkwan University

System Packaging Research Center Korea Electronics Technology Institute

System Packaging Research Center, Korea Electronics Technology Institute

Technical R&D Center, Semi-Materials Co., Ltd., Yeongcheon, Gyeongbuk 770-803, Republic of Korea

Technical Research Laboratories Posco

Technical Research Laboratories, POSCO

Technology Development Memory Device Business Samsung Electronicss Co.

Technology Development, Memory Device Business, Samsung Electronicss Co.

Technology Development, Memory Device Business, Samsung Electronicss Co., San #24, Nongseo–lee, Kiheung–eup, Yongin–gun, Kyungki–do, Korea

The Authors Are With The Department Of Electrical Engineering

The authors are with the Department of Information and Communications, Kwang-Ju Institute of Science and Technology

The Catholic University of Korea, Seoul St. Mary's Hospital

The Catholic University of Korea, Seoul St. Mary's Hospital

the Center for Information and Security Technologies, Korea University

The Dow Chemical Company, Dow Electronic Materials