OHSHIMA Shin-ichi | 論文著者

Department of Electronics and Information Science, Faculty of Engineering, Kyoto Institute of Technology

Frequency Measurement Systems Section National Metrology Institute Of Japan

Frequency Measurement Systems Section, National Metrology Institute of Japan

National Metology Institute Of Japan

National Metology Institute Of Japan/aist

National Metrology Institute of Japan (NMIJ), AIST, Tsukuba, Ibaraki 305-8563, Japan

National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8563, Japan

National Metrology Institute of Japan/AIST

National Metrology Institute of Japan/AIST, Tsukuba 305-8563, Japan

National Research Laboratory Of Metrology

National Research Laboratory of Metrology, 1-1-4, Umezono, Tsukuba, Ibaraki 305-8563, Japan

Quantum Standards Section Quantum Metrology Department National Research Laboratory Of Metrology

Quantum Standards Section, Quantum Metrology Department, National Research Laboratory of Metrology

Time Standards Section Time And Freqency Division National Metrololgy Institute Of Japan Aist