Nishihara Hiroshi | 論文著者

Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, Suita, Osaka 565-0871, Japan

Department Of Electronics Faculty Of Engineering Osaka University

Department Of Electronics Graduate School Of Engineering Osaka University

Department of Electronics, Faculty of Engineering, Osaka University

Department of Electronics, Faculty of Engineering, Osaka University, 2–1 Yamada–oka, Suita–shi, Osaka 565, Japan

Department of Electronics, Faculty of Engineering, Osaka University, 2–1, Yamada–Oka, Suita, Osaka 565, Japan

Department of Electronics, Graduate School of Engineering, Osaka University

Department of Electronics, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan

Department of Electronics, Graduate School of Engineering, Osaka University, 2-1, Yamada-Oka, Suita, Osaka 565-0871, Japan

Department of Electronics, Graduate School of Engineering, Osaka University, 2–1, Yamada–Oka, Suita, Osaka 565, Japan

Department Of Nuclear Engineering Faculty Of Engineering Kyoto University

Department Of Nuclear Engineering Kyoto University

Department of Nuclear Engineering, Faculty of Engineering, Kyoto University

Department of Nuclear Engineering, Kyoto University

Department of Nuclear Engineering, Kyoto University, Kyoto-shi

Department of Nuclear Engineering,Faculty of Engineering,Kyoto University

Department of Nuclear Engineering,Kyoto University

Department Of Pathology Hokkaido University School Of Medicine

Department of Pathology, Hokkaido University School of Medicine

Department Of Translational Pathology Hokkaido University Graduate School Of Medicine