Kurashima Yuichi | 論文著者

Department Of Applied Electronics Tokyo University Of Science

Department of Applied Electronics, Tokyo University of Science

Department of Applied Electronics, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba 278-8510, Japan

Department of Mechanical Systems Engineering, University of Yamanashi, Japan

MIRAI Project, Advanced Semiconductor Research Center (ASRC), National Institute of Advanced Industrial Science and Technology (AIST)

MIRAI Project, Advanced Semiconductor Research Center (ASRC), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan

MIRAI, Advanced Semiconductor Research Center (ASRC), National Institute of Advanced Industrial Scie

MIRAI, Advanced Semiconductor Research Center (ASRC), National Institute of Advanced Industrial Science and Technology (AIST)

MIRAI, Advanced Semiconductor Research Center (ASRC), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan

MIRAI, Advanced Semiconductor Research Center (ASRC), National Institute of Advanced Industrial Science and Technology (AIST)|Department of Applied Electronics, Tokyo University of Science

MIRAI, Advanced Semiconductor Research Center, National Institute of Advanced Industrial Science and Technology

MIRAI, Advanced Semiconductor Research Center, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan

Research Center for Ubiquitous MEMS and Micro Engineering (UMEMSME), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8564, Japan.

School of Fundamental Engineering, Tokyo University of Science

School of Fundamental Engineering, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba 192-0045, Japan