Kim Sang-Hun | 論文著者

(独)産業技術総合研究所ネットワークフォトニクス研究センター

Analog Integrated Circuit Lab. School Of Electronic Engineering Kumoh National Instisute Of Technology

Analog Integrated Circuit Lab., School of Electronic Engineering, Kumoh National Instisute of Technology

Department Of Eee Tokyo Institute Of Technology

Department of EEE, Tokyo Institute of Technology

Photonic And Electronic Thin Film Laboratory Department Of Materials Science And Engineering Chonnam

Photonic And Electronic Thin Film Laboratory Department Of Materials Science And Engineering Chonnam

Photonic And Electronic Thin Film Laboratory Department Of Materials Science And Engineering Chonnam

Photonic And Electronic Thin Film Laboratory Department Of Materials Science And Engineering Chonnam

Photonic And Electronic Thin Film Laboratory Department Of Materials Science And Engineering Chonnam

Photonic And Electronic Thin Film Laboratory Department Of Materials Science And Engineering Chonnam

Photonic And Electronic Thin Film Laboratory Department Of Materials Science And Engineering Chonnam

Photonic And Electronic Thin Film Laboratory Department Of Materials Science And Engineering Chonnam National University

Photonic and Electronic Thin Film Laboratory, Department of Materials Science and Engineering, Chonnam National University

Photonic and Electronic Thin Film Laboratory, Department of Materials Science and Engineering, Chonnam National University, 300 Yongbong-Dong, Puk-Gu, Kwangju 500-757, Korea

School Of Electronic Engineering Kumoh National Institute Of Technology

School of Electronic Engineering, Kumoh National Institute of Technology

Structure Analysis Team, Korea Testing Laboratory