HIRAI Yoshihiko | 論文著者

Osaka Prefecture University, Department of Physics and Electronics Engineering, Graduate School of Engineering|Japan Science and Technology Agency, CREST (Core Research of Evolutional Science & Technology)

Osaka Prefecture University, Department of Physics and Electronics Engineering, Graduate School of Engineering|Japan Science and Technology Agency, CREST(Core Research of Evolutional Science & Technology)

Physics And Electronics Engineering Osaka Prefecture University

Physics and Electronics Engineering, Graduate School of Engineering, Osaka Prefecture University, Sakai 599-8531, Japan

Physics and Electronics Engineering, Osaka Prefcure University, 1-1 Gakuencho, Naka-ku, Sakai 599-8531, Japan

Physics and Electronics Engineering, Osaka Prefecture University

Physics and Electronics Engineering, Osaka Prefecture University, Sakai 599-8531, Japan

Physics and Electronics, Graduate School of Engineering, Osaka Prefecture University

Physics and Electronics, Graduate School of Engineering, Osaka Prefecture University,|CREST-JST

Physics and Electronics, Graduate School of Engineering, Osaka Prefecture University|CREST-JST

Semiconductor Research Center Matsushita Electric Industrial Co. Ltd.

Semiconductor Research Center, Matsushita Electric Ind. Co. Ltd.

Semiconductor Research Center, Matsushita Electric Ind. Co. Ltd., Moriguchi, Osaka 570

Semiconductor Research Center, Matsushita Electric Ind. Co., Ltd., 3–1–1 Yagumo–nakamachi, Moriguchi, Osaka 570, Japan

Semiconductor Research Center, Matsushita Electric Industrial Co., Ltd.

Semiconductor Research Center, Matsushita Electric Industrial Co., Ltd.,

Semiconductor Research Center, Matsushita Electric Industrial Co., Ltd., Moriguchi, Osaka, 570 Japan

The Graduate School of Natural Science and Technology, Okayama University

the Semiconductor Research Center, Matsushita Electric Industrial Co., Ltd.