FUKUDA Yukio | 論文著者

Advanced Materials & Chracterization, Texas Instruments Tsukuba Research ↦ Development Center Lt

Department of Electronic System Engineering, Faculty of System Engineering, Tokyo University of Science, Suwa, 5000-1 Toyohira, Chino, Nagano 391-0292, Japan

Department of Electronic System Engineering, Tokyo University of Science, Suwa, Chino, Nagano 391-0292, Japan

Department of Electronic Systems Engineering, Faculty of Systems Engineering, Tokyo University of Science, Suwa, 5000-1 Toyohira, Chino, Nagano 391-0292, Japan

Department Of Physics Faculty Of Science Kyoto University

Department Of Physics Kyoto University

Department of Physics, Faculty of Science, Kobe University

Department of Physics, Faculty of Science, Kobe University, Kobe 657-8501

Department of Physics, Faculty of Science, Kobe University, Nada, Kobe 657-8501, Japan

Department of Physics, Kyoto University

Department of Physics,Faculty of Science,Kyoto University

Department of Physics,Kyoto University

Economics Kyoto Sangyo University

Economics, Kyoto Sangyo University

Faculty of Science, Kyoto University

JAEA

Ntt Applied Electronics Laboratories

Ntt Electrical Communications Laboratories

Ntt Musashino Electrical Communication Laboratories Nippon Telegraph And Telephone Corporation

NTT Musashino Electrical Communication Laboratories, Nippon Telegraph and Telephone Corporation