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Chang Shoou-Jinn | 論文著者
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Chang Shoou-Jinn
Institute of Microelectronics and the Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan
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Chang Shoou-jinn
Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University
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Chang Shoou-jinn
Institute Of Microelectronics National Cheng Kung University
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Chang Shoou-Jinn
Institute of Microelectronics, Department of Electrical Engineering
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Chang Shoou-Jinn
Institute of Microelectronics, Department of Electrical Engineering Center for Micro/Nano Science and Technology Advanced Optoelectronic Technology Center, National Cheng Kung University, 1 University Road, Tainan 701, Taiwan
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Chang Shoou-Jinn
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University Tainan 701, Taiwan
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Chang Shoou-Jinn
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, 1 University Road, Tainan 701, Taiwan
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Chang Shoou-Jinn
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C.
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Chang Shoou-Jinn
Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, Tainan 70101, Taiwan, ROC
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Chang Shoou-Jinn
Institute of Microelectronics, National Cheng Kung University, No. 1, University Rd., Tainan 701, Taiwan, R.O.C.
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Chang Shoou-jinn
National Cheng Kung University Institute Of Microelectronics Department Of Electrical Engineering
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CHANG Shoou-Jinn
National Cheng Kung University, Institute of Microelectronics, Department of Electrical Engineering