Schottky contact on ZnO nano-columnar film with H2O2 treatment
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The surface treatment with boiling hydrogen peroxide (H2O2) solution on the surface of ZnO nano-columnar film was investigated. Field emission-SEM and TEM analysis revealed that amorphous ZnO2 layer covers the ZnO nano-column surface through the H2O2 treatment at 100 degrees C for 1 min. X-ray photoemission spectroscopy (XPS) has been conducted on the H2O2 treated ZnO surface. The surface exhibits high resistive conductivity after the H2O2 treatment, suggesting that the treatment promotes a compensation effect. We demonstrate that dramatic improvement in the rectifying behavior on the Schottky diodes can be achieved by inserting a ZnO2 interface layer between the Pt Schottky electrode and the ZnO nano-column film. The ZnO2 interface layer promotes surface passivation and suppresses the surface leakage current. This is expected to increase the Schottky barrier height to 0.78 eV. The H2O2 treated Schottky diode showed five orders of magnitude in current rectification between forward and reverse bias at 3 V. (C) 2011 American Institute of Physics.
- 2011-05-10
論文 | ランダム
- モンティーホールジレンマにおける選択の偏好に関する探索的研究 : 自由記述の分析
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- 青年期の友人関係における心理的距離に関する研究動向と発達的意義
- 青年期の自己受容と友人関係--自己に対するメタレベル肯定度という観点からの,現実の友人とのつきあい方,満足感,山アラシ・ジレンマの検討
- モンティーホールジレンマにおける選択の偏好に関する探索的研究・自由記述の分析