Local valence electronic states of SiO2 ultrathin films grown on Si(100) studied using auger photoelectron coincidence spectroscopy: observation of upward shift of valence-band maximum as a function of SiO2 thickness

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概要

• 論文の詳細を見る
• Physical Society of Japanの論文

著者

• Mase Kazuhiko

  School Of High Energy Accelerator Science The Graduate University For Advanced Studies

関連論文

• Construction and Evaluation of a Miniature Electron Ion Coincidence Analyzer Mounted on a Conflat Flange with an Outer Diameter of 114mm
• Local valence electronic states of SiO2 ultrathin films grown on Si(100) studied using auger photoelectron coincidence spectroscopy: observation of upward shift of valence-band maximum as a function of SiO2 thickness

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