RIPESS Lux'09第4回世界会議報告 グローバル化する連帯
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概要
論文 | ランダム
- Xe precipitates at grain boundaries in Al under 1 MeV electron irradiation
- High-resolution electron microscopy study of defect structures in γ-TiAl irradiated with 15 keV He ions in a high-voltage transmission electron microscope
- A new simple method to introduce marker-free deletions in the Bacillus subtilis genome
- The accurate replacement of long genome region more than several hundreds kilobases in Bacillus subtilis
- 家庭復帰した脳血管障害患者の自尊感情と社会生活要因との関連