In-Situ X-ray Topographic Study of Dislocations in Silicon Crystals Growing from the Melt
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概要
NHK放送科学基礎研究所 | 論文
- Preparation and Characterization of Low-Voltage Cathodoluminescent ZnS
- Low-Voltage Cathodoluminescence of ZnS Single Crystals
- Refractive Indices of Paratellurite and Lithium Iodate in the Visible and Ultraviolet Regions
- The measurement of the antisymmetric components of nonlinear optical susceptibilities of TeO2 crystal
- Interrelation between the antisymmetric components of nonlinear optical susceptibility and the symmetric ones in the Kleinman symmetry relation