Si-Ion Implantation Doping in \beta-Ga
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概要
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We developed a donor doping technique for \beta-Ga<inf>2</inf>O<inf>3</inf>by using Si-ion (Si<sup>+</sup>) implantation. For the implanted Ga<inf>2</inf>O<inf>3</inf>substrates with \text{Si^{+}}=1\times 10^{19}{\mbox{--}}5\times 10^{19} cm<sup>-3</sup>, a high activation efficiency of above 60% was obtained after annealing in a nitrogen gas atmosphere at a relatively low temperature of 900--1000 °C. Annealed Ti/Au electrodes fabricated on the implanted Ga<inf>2</inf>O<inf>3</inf>layers showed ohmic behavior. The Ga<inf>2</inf>O<inf>3</inf>with \text{Si^{+}}=5\times 10^{19} cm<sup>-3</sup>showed the lowest specific contact resistance and resistivity obtained in this work of 4.6\times 10^{-6} \Omega\cdotcm<sup>2</sup>and 1.4 m\Omega\cdotcm, respectively.
- 2013-08-25
著者
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HIGASHIWAKI Masataka
National Institute of Information and Communications Technology
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Yamakoshi Shigenobu
Tamura Co. Ltd.
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Masui Takekazu
Koha Co. Ltd.
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Sasaki Kohei
Tamura Co. Ltd.
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Kuramata Akito
Tamura Co. Ltd.
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Yamakoshi Shigenobu
Tamura Corporation, Sayama, Saitama 350-1328, Japan
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Higashiwaki Masataka
National Institute of Information and Communications Technology, Koganei, Tokyo 184-8795, Japan
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