Raman Temperature Measurements of Copper Phthalocyanine Layer of Organic Light-Emitting Diode Using Bandwidth--Temperature Relationship
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概要
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We have estimated the temperature of a buried copper phthalocyanine (CuPc) layer in an organic light-emitting diode with the glass/indium--tin-oxide (ITO)/CuPc/N,N\aku '-di-1-naphthaleyl-N,N\aku '-diphenyl-1,1'-biphenyl-4,4'-diamine (NPD)/tris(8-quinolinolato)aluminum(III) (Alq<inf>3</inf>)/LiF--Al structure from the full width at half-maximum (FWHM) of a Raman band at around 1528 cm<sup>-1</sup>. The FWHMs of the band were measured at temperatures in the range from 25 to 200 °C. A linear equation was obtained from the observed data by the least-squares method. We estimated the temperature of the CuPc layer in an operating organic light-emitting diode at current densities from 100 to 1000 mA/cm<sup>2</sup>using this relationship. The highest temperature was 148 \pm 4 °C at a current density of 1000 mA/cm<sup>2</sup>.
- 2013-05-25
著者
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HIROSE Masaki
Department of Biochemistry & Molecular Pathology, Osaka City University Medical School
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Furukawa Yukio
Department Of Chemistry And Biochemistry School Of Advanced Science And Engineering Waseda Universit
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Hirose Masaki
Department of Chemistry and Biochemistry, School of Advanced Science and Engineering, Waseda University, Shinjuku, Tokyo 169-8555, Japan
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Iwasaki Ryota
Department of Chemistry and Biochemistry, School of Advanced Science and Engineering, Waseda University, Shinjuku, Tokyo 169-8555, Japan
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