Power Linearity Measurement in Terahertz Time-Domain Spectroscopy Using Metalized Film Attenuators

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概要

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• We describe a method for evaluating the power linearity over a wide dynamic range of a terahertz time-domain spectroscopy (THz-TDS) system. The dynamic range is achieved by means of metalized film attenuators (MFAs). The evaluation was based on repeated measurements of transmittance in a particular sample at different incident power levels. We apply the method to both focused- and collimated-beam systems and show that the method can be applied to reflectance measurements as well.

• 2011-12-25

著者

• Kitagishi Keiko

  Otsuka Electronics Co.

• Kinoshita Moto

  National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8563, Japan

• Iida Hitoshi

  National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8563, Japan

• Shimada Yozo

  National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8563, Japan

• Kuroda Hideki

  Otsuka Electronics, Hirakata, Osaka 573-1132, Japan

• Izutani Yusuke

  Otsuka Electronics, Hirakata, Osaka 573-1132, Japan

関連論文

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