Waveguide Two-Point Differential-Excitation Method for Quantitative Absorption Measurements of Nanostructures
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概要
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To establish a new useful quantitative absorption measurement method for nanostructures, we investigated quantitative accuracy of a recently developed waveguide two-point differential-excitation method, which combines Fabry--Pérot fringe analysis and attenuated internal emission analysis for differential-path-length excitations. Quantitative absorption spectra of an 8-nm-thick GaAs quantum well at various temperatures consistent with theoretical predictions are demonstrated within 5% relative accuracy and a high dynamic range of 0--210 cm-1 in modal absorptions. The results were also compared with conventional photoluminescence excitation spectra of the same sample, which turned out to underestimate the absorption peak intensity of the lowest exciton at low temperatures.
- 2012-10-25
著者
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Yoshita Masahiro
Institute For Solid State Physics The University Of Tokyo
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Akiyama Hidefumi
Institute For Solid State Physics University Of Tokyo
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Pfeiffer Loren
Department of Electrical Engineering, Princeton University, Princeton, NJ 08544, U.S.A.
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West Ken
Department of Electrical Engineering, Princeton University, Princeton, NJ 08544, U.S.A.
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Fukuda Keisuke
Institute for Solid State Physics, University of Tokyo, Kashiwa, Chiba 277-8581, Japan
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Kim Changsu
Institute for Solid State Physics, University of Tokyo, Kashiwa, Chiba 277-8581, Japan
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MOCHIZUKI Toshimitsu
Institute for Solid State Physics, The University of Tokyo
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Mochizuki Toshimitsu
Institute for Solid State Physics, University of Tokyo, Kashiwa, Chiba 277-8581, Japan
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Maruyama Shun
Institute for Solid State Physics, University of Tokyo, Kashiwa, Chiba 277-8581, Japan
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Kim Changsu
Institute for Solid State Physics, University of Tokyo, and JST-CREST, Kashiwa, Chiba 277-8581, Japan
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West Ken
Department of Electrical Engineering, Princeton University, Princeton, NJ 08540, U.S.A.
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Pfeiffer Loren
Department of Electrical Engineering, Princeton University, Princeton, NJ 08540, U.S.A.
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