Characterization of Ionic Impurities Adsorbed onto a 5° SiOx Alignment Film
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概要
- 論文の詳細を見る
Dielectric spectroscopy is used to clarify the ion adsorption on a 5° SiOx alignment film. The results show that both ion concentration and dc conductivity decrease after ion adsorption. The decrease in ions concentration mainly comes from large ionic impurities, possibly corresponding to the colloids formed by ions associated with water. Also, it is found by simulating the voltage holding ratio (VHR) that the long-term voltage decay is determined by the dc conductivity of liquid crystal (LC), which corresponds to ions whose concentration is kept constant. This is interpreted as evidence for the assumption that ion concentration is determined by the solubility of LCs, which is determined by the water concentration in LCs.
- 2012-03-25
著者
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BOS Philip
Liquid Crystal Institute
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Huang Yi
Liquid Crystal Institute, Kent State University, Kent, OH 44240, U.S.A.
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Bos Philip
Liquid Crystal Institute, Kent State University, Kent, OH 44240, U.S.A.
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Bhowmik Achintya
Intel Corporation, 2200 Mission College Blvd, Santa Clara, CA 95054, U.S.A.
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