The Diagnosis Method for High-Energy Ion Beams Using Backscattered Particles for Laser-Driven Ion Acceleration Experiments

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概要

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• A single CR-39 detector mounted on plastic plates is irradiated with a 100 MeV He ion beam. Although the beam energy is much greater than the detection threshold limit of the CR-39 detector, a large number of etch pits having elliptical openings are observed on the rear surface. Detailed investigations reveal that these etch pits are created by heavy ions inelastically backscattered from the plastic plates. This method allows a simple diagnosis of the ion beam profile and the presence of the high-energy component beyond the detection threshold limit of the CR-39 detector, especially in mixed-radiation fields such as laser-driven ion acceleration experiments.

• 2012-05-25

著者

• Kamiya Tomihiro

  Japan Atomic Energy Agency, Takasaki, Gunma 370-1292, Japan

• Sakaki Hironao

  Japan Atomic Energy Agency, Kizugawa, Kyoto 619-0215, Japan

• Hori Toshihiko

  Japan Atomic Energy Agency, Kizugawa, Kyoto 619-0215, Japan

• Kondo Kiminori

  Japan Atomic Energy Agency, Kizugawa, Kyoto 619-0215, Japan

• Yamauchi Tomoya

  Graduate School of Maritime Sciences, Kobe University, Kobe 658-0022, Japan

• ODA Keiji

  Graduate School of Maritime Sciences, Kobe University

• KANASAKI Masato

  Graduate School of Maritime Sciences, Kobe University

• Tampo Motonobu

  Japan Atomic Energy Agency, Kizugawa, Kyoto 619-0215, Japan

• Fukuda Yuji

  Japan Atomic Energy Agency, Kizugawa, Kyoto 619-0215, Japan

• Kurashima Satoshi

  Japan Atomic Energy Agency, Takasaki, Gunma 370-1292, Japan

• YAMAUCHI Tomoya

  Graduate School of Maritime Sciences, Kobe University

• KONDO Kiminori

  Japan Atmic Energy Agency, 8-1-7 Umemidai, Kizugawa, Kyoto 619-0215, Japan

• HORI Toshihiko

  Japan Atmic Energy Agency, 8-1-7 Umemidai, Kizugawa, Kyoto 619-0215, Japan

• SAKAKI Hironao

  Japan Atmic Energy Agency, 8-1-7 Umemidai, Kizugawa, Kyoto 619-0215, Japan

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