Controllability of Electrical Conductivity by Oxygen Vacancies and Charge Carrier Trapping at Interface between CoO and Electrodes

概要

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Recently, the role of resistance random access memory (RRAM) is becoming extremely important in the development of nonvolatile memories. RRAM works by changing the resistance of the transition metal oxide contained in RRAM after the application of a sufficiently high voltage, however, this switching mechanism has not been fully clarified. In this study, by performing first principles calculations based on the density functional theory, we first investigate the change in the property of bulk CoO resulting from oxygen vacancies and charge carrier trapping in the vicinity of the oxygen vacancies. Next, we perform calculations for slab models of CoO in contact with Ta, W, and Pt electrodes and hence investigate the effects of oxygen vacancies at the interface between the CoO layer and the electrode layer. On the basis of the obtained results, we conclude that W is the most suitable electrode material compared with Ta and Pt.
2011-07-25