Determination of Crystallographic Axes of Photonic Crystal Fiber by Transversal Scanning Method
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概要
- 論文の詳細を見る
We present a method for determining crystallographic symmetry axes in an air-hole structure of a photonic crystal fiber (PCF) with a hexagonal structure. This method is based on the measurement of intensity distribution of the light transversely scattered from the PCF. The symmetry axes can be determined from the distinctive intensity pattern that is repeated for an axial rotation of the PCF. Simulations and experimental studies reveal that the technique is reliable and quite sensitive to the angle between the crystallographic symmetry axis and the launched light.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2010-10-25
著者
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Lee Sang
Photonics Research Center Korea Institute Of Science And Technology
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Lim Sun
Photonics Sensor System Center, Korea Institute of Science and Technology (KIST), Seoul 130-791, Korea
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Lim Sun
Photonics Sensor System Center, Korea Institute of Science and Technology, Seoul 136-791, Korea
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Lee Sun-Goo
Photonics Sensor System Center, Korea Institute of Science and Technology, Seoul 136-791, Korea
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Lee Kwanil
Photonics Sensor System Center, Korea Institute of Science and Technology, Seoul 136-791, Korea
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Lee Sun-Goo
Photonics sensor system Center, Korea Institute of Science and Technology (KIST), Seoul 136-791, Korea
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Lee Kwanil
Photonics Research Laboratory, Division of Intelligent System, Korea Institute of Science and Technology (KIST), Seoul 130-791, Korea
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